Tuesday, June 28, 2011

Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM)

A scanning electron microscopy (SEM) machine was used to study the surface morphology of the acrylonitrile treated OBF. The microscopic utmost importance in characterizing the structural changes that have occurred upon treatment.

Scanning Electron Microscope:
Model: Philips XL-30

Specification of SEM: Magnification 100000X
Excitation voltage 30 kv
Equipped with vacuum pump
Equipped with EDS

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